We present the optical characterization of MOVPE grown ZnSeTe1-x epilayers with 0<x<0.35 and ZnSexTe1-x single quantum wells (SQWs) with L(z) = 2.0-8.5 nm. The structures were investigated using photoreflectance and photoluminescence spectroscopy. Transmission electron microscope analysis was used to determine quantum well thickness. The studied ZnSe0.3Te0.7 SWQs show a bright emission band with a halfwidth approximately 10 meV in the spectral region of 100-250 meV below the band gap of the corresponding mixed crystal. We suggest a type Il bands alignment in ZnSexTe1-x/ZnTe single quantum wells.