NON-OPTICAL CHARACTERIZATION OF OPTICAL COATINGS

[21] Benninghoven A., 1976, Critical Reviews in Solid State Sciences, V6, P291, DOI 10.1080/10408437608243561

[22] OBSERVATION ON SURFACE-REACTIONS WITH STATIC METHOD OF SECONDARY ION MASS-SPECTROMETRY .1. METHOD [J]. SURFACE SCIENCE, 1971, 28 (02) : 541 - +

[23] CHARACTERIZATION OF COATINGS [J]. THIN SOLID FILMS, 1976, 39 (DEC) : 3 - 23

[24] SURFACE INVESTIGATION OF SOLIDS BY STATICAL METHOD OF SECONDARY ION MASS SPECTROSCOPY (SIMS) [J]. SURFACE SCIENCE, 1973, 35 (01) : 427 - 457

[25] ANALYSIS OF MONOMOLECULAR LAYERS OF SOLIDS BY SECONDARY ION EMISSION [J]. ZEITSCHRIFT FUR PHYSIK, 1970, 230 (05): : 403 - +

[26] REFINING AND OPTIMIZATION IN MULTILAYERS [J]. APPLIED OPTICS, 1981, 20 (01): : 66 - 73

[27] SURFACE AND NEAR-SURFACE STRUCTURE OF SILICATE-GLASSES [J]. SURFACE SCIENCE, 1978, 76 (01) : 160 - 185

[28] ANALYSIS OF COATINGS AND THIN-FILMS USING ENERGETIC IONS [J]. THIN SOLID FILMS, 1979, 64 (03) : 403 - 407

[29] USE OF FOURIER COEFFICIENTS IN MULTILAYER SYNTHESIS COMPUTATIONS [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1978, 68 (07) : 964 - 972

[30] Brummer O., 1980, HDB FESTKORPERANALYS

[21] Benninghoven A., 1976, Critical Reviews in Solid State Sciences, V6, P291, DOI 10.1080/10408437608243561

[22] OBSERVATION ON SURFACE-REACTIONS WITH STATIC METHOD OF SECONDARY ION MASS-SPECTROMETRY .1. METHOD [J]. SURFACE SCIENCE, 1971, 28 (02) : 541 - +

[23] CHARACTERIZATION OF COATINGS [J]. THIN SOLID FILMS, 1976, 39 (DEC) : 3 - 23

[24] SURFACE INVESTIGATION OF SOLIDS BY STATICAL METHOD OF SECONDARY ION MASS SPECTROSCOPY (SIMS) [J]. SURFACE SCIENCE, 1973, 35 (01) : 427 - 457

[25] ANALYSIS OF MONOMOLECULAR LAYERS OF SOLIDS BY SECONDARY ION EMISSION [J]. ZEITSCHRIFT FUR PHYSIK, 1970, 230 (05): : 403 - +

[26] REFINING AND OPTIMIZATION IN MULTILAYERS [J]. APPLIED OPTICS, 1981, 20 (01): : 66 - 73

[27] SURFACE AND NEAR-SURFACE STRUCTURE OF SILICATE-GLASSES [J]. SURFACE SCIENCE, 1978, 76 (01) : 160 - 185

[28] ANALYSIS OF COATINGS AND THIN-FILMS USING ENERGETIC IONS [J]. THIN SOLID FILMS, 1979, 64 (03) : 403 - 407

[29] USE OF FOURIER COEFFICIENTS IN MULTILAYER SYNTHESIS COMPUTATIONS [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1978, 68 (07) : 964 - 972

[30] Brummer O., 1980, HDB FESTKORPERANALYS