CHARACTERIZATION OF COATINGS

被引：22

作者：

BENNINGHOVEN, A ^{[1
]}

机构：

[1] UNIV MUNSTER,INST PHYS,D-4400 MUNSTER,FED REP GER

来源：

THIN SOLID FILMS | 1976年 / 39卷 / DEC期

关键词：

D O I：

10.1016/0040-6090(76)90620-9

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

收藏

页码：3 / 23

页数：21

相关论文

共 45 条

[1] ANALYSIS OF SURFACE-LAYERS BY LIGHT ION BACKSCATTERING AND SPUTTERING COMBINED WITH AUGER-ELECTRON SPECTROSCOPY (AES)
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[2] ON SPUTTERING MECHANISM IN ENERGY RANGE OF RUTHERFORD BACKSCATTERING
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[J]. PHYSICA STATUS SOLIDI, 1969, 34 (02): : K169 - +
[6] SURFACE INVESTIGATION OF SOLIDS BY STATICAL METHOD OF SECONDARY ION MASS SPECTROSCOPY (SIMS)
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[J]. SURFACE SCIENCE, 1973, 35 (01) : 427 - 457
[7] ANALYSIS OF MONOMOLECULAR LAYERS OF SOLIDS BY SECONDARY ION EMISSION
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[J]. ZEITSCHRIFT FUR PHYSIK, 1970, 230 (05): : 403 - +
[8] SECONDARY-ION EMISSION OF AMINO-ACIDS
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[J]. APPLIED PHYSICS, 1976, 11 (01): : 35 - 39
[9] BENNINGHOVEN A, 1973, APPL PHYS, V1, P1
[10] Brandis E. K., 1975, Scanning Electron Microscopy 1975, P141

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