THE ELECTRICAL BREAKDOWN DURING ANODIZING OF HIGH-PURITY ALUMINUM IN BORATE SOLUTIONS

被引：56

作者：

SHIMIZU, K

THOMPSON, GE

WOOD, GC

机构：

来源：

THIN SOLID FILMS | 1982年 / 92卷 / 03期

关键词：

D O I：

10.1016/0040-6090(82)90005-0

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：231 / 241

页数：11

共 16 条

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[8] ELECTRICAL BREAKDOWN .2. DURING THE ANODIC GROWTH OF ALUMINUM-OXIDE [J].

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[9] THE GENERATION OF FLAWS IN ANODIC BARRIER-TYPE FILMS ON ALUMINUM [J].

SHIMIZU, K ;

THOMPSON, GE ;

WOOD, GC .

ELECTROCHIMICA ACTA, 1982, 27 (02) :245-250

[10] COMMENTS ON EMPIRICAL RELATION BETWEEN INTENSITY OF LUMINESCENCE AND FILM THICKNESS DURING ANODIZATION OF ALUMINUM [J].

SHIMIZU, K .

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