SCANNING NEAR-FIELD OPTICAL MICROSCOPY IN BASEL, RUSCHLIKON, AND ZURICH

被引：20

作者：

HEINZELMANN, H

HUSER, T

LACOSTE, T

GUNTHERODT, HJ

POHL, DW

HECHT, B

NOVOTNY, L

MARTIN, OJF

HAFNER, CV

BAGGENSTOS, H

WILD, UP

RENN, A

机构：

[1] IBM CORP,DIV RES,ZURICH RES LAB,CH-8803 RUSCHLIKON,SWITZERLAND

[2] ETH ZURICH,INST FIELD THEORY & HIGH FREQUENCY ELECTR,CH-8092 ZURICH,SWITZERLAND

[3] ETH ZENTRUM,PHYS CHEM LAB,CH-8092 ZURICH,SWITZERLAND

来源：

OPTICAL ENGINEERING | 1995年 / 34卷 / 08期

关键词：

SCANNING NEAR-FIELD OPTICAL MICROSCOPY; PHOTON-SCANNING TUNNELING MICROSCOPY; EVANESCENCE; SHEAR FORCE IMAGING; MULTIPLE MULTIPOLE METHOD; LIGHT CONFINEMENT; FLUORESCENCE; SINGLE-MOLECULE SPECTROSCOPY;

D O I：

10.1117/12.205670

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The concepts of near-field optical microscopy and experimental and theoretical work carried out in Switzerland over the last 10 years are reviewed. After a description of the pioneering experiments of the mid-1980s, we focus on the recent efforts of the three Swiss laboratories currently working in the field in close collaboration. This newly refreshed initiative in near-field optics is supported by the Swiss Priority Program Optique.

引用

页码：2441 / 2454

页数：14

共 38 条

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