HIGH RESOLUTION DIVERGENT-BEAM X-RAY TOPOGRAPHY

[1] Authier A., 1967, ADVANCES XRAY ANALYS, V10, P9

[2] COMPTON AH, 1935, X RAYS THEORY EXPERI

[3] HIGH-RESOLUTION X-RAY-DIFFRACTION TOPOGRAPHY USING KBETA RADIATION [J]. JOURNAL OF APPLIED PHYSICS, 1967, 38 (10) : 4094 - &

[4] KALPHA2 RADIATION MONOCHROMATED BY A NEW FILTER AND ITS TOPOGRAPHICAL AND OTHER APPLICATIONS [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1968, 7 (01) : 1 - &

[5] X-RAY TOPOGRAPHIC STUDIES OF DISLOCATIONS IN IRON-SILICON ALLOY SINGLE CRYSTALS [J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1965, 285 (1401) : 297 - +

[6] DIRECT OBSERVATION OF INDIVIDUAL DISLOCATIONS BY X-RAY DIFFRACTION [J]. JOURNAL OF APPLIED PHYSICS, 1958, 29 (03) : 597 - 598

[7] THE PROJECTION TOPOGRAPH - A NEW METHOD IN X-RAY DIFFRACTION MICRORADIOGRAPHY [J]. ACTA CRYSTALLOGRAPHICA, 1959, 12 (03): : 249 - 250

[8] APPLICATIONS OF LIMITED PROJECTION TOPOGRAPHS AND DIRECT BEAM TOPOGRAPHS IN DIFFRACTION TOPOGRAPHY [J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1963, 14 (12): : 904 - &

[9] DISLOCATIONS IN SILICON DUE TO LOCALIZED DIFFUSION [J]. JOURNAL OF APPLIED PHYSICS, 1966, 37 (12) : 4394 - +

[10] 1962, INT TABLES X RAY CRY, V3

[1] Authier A., 1967, ADVANCES XRAY ANALYS, V10, P9

[2] COMPTON AH, 1935, X RAYS THEORY EXPERI

[3] HIGH-RESOLUTION X-RAY-DIFFRACTION TOPOGRAPHY USING KBETA RADIATION [J]. JOURNAL OF APPLIED PHYSICS, 1967, 38 (10) : 4094 - &

[4] KALPHA2 RADIATION MONOCHROMATED BY A NEW FILTER AND ITS TOPOGRAPHICAL AND OTHER APPLICATIONS [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1968, 7 (01) : 1 - &

[5] X-RAY TOPOGRAPHIC STUDIES OF DISLOCATIONS IN IRON-SILICON ALLOY SINGLE CRYSTALS [J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1965, 285 (1401) : 297 - +

[6] DIRECT OBSERVATION OF INDIVIDUAL DISLOCATIONS BY X-RAY DIFFRACTION [J]. JOURNAL OF APPLIED PHYSICS, 1958, 29 (03) : 597 - 598

[7] THE PROJECTION TOPOGRAPH - A NEW METHOD IN X-RAY DIFFRACTION MICRORADIOGRAPHY [J]. ACTA CRYSTALLOGRAPHICA, 1959, 12 (03): : 249 - 250

[8] APPLICATIONS OF LIMITED PROJECTION TOPOGRAPHS AND DIRECT BEAM TOPOGRAPHS IN DIFFRACTION TOPOGRAPHY [J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1963, 14 (12): : 904 - &

[9] DISLOCATIONS IN SILICON DUE TO LOCALIZED DIFFUSION [J]. JOURNAL OF APPLIED PHYSICS, 1966, 37 (12) : 4394 - +

[10] 1962, INT TABLES X RAY CRY, V3