DIGITAL SCANNING AUGER-ELECTRON MICROSCOPE INCORPORATING A CONCENTRIC HEMISPHERICAL ANALYZER

被引：19

作者：

BROWNING, R ^{[1
]}

BASSETT, PJ ^{[1
]}

ELGOMATI, MM ^{[1
]}

PRUTTON, M ^{[1
]}

机构：

[1] UNIV YORK, DEPT PHYS, HESLINGTON YO1 5DD, YORKSHIRE, ENGLAND

来源：

关键词：

D O I：

10.1098/rspa.1977.0164

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

引用

页码：213 / +

共 22 条

[11] INSTRUMENT RESPONSE FUNCTIONS FOR POTENTIAL MODULATION DIFFERENTIATION
HOUSTON, JE
PARK, RL
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1972, 43 (10) : 1437 - &
[12] NEW SEMI-AUGER MICROANALYZER WITH UHV CAPABILITY
ISHIDA, T
UCHIYAMA, M
ODA, Z
HASHIMOTO, H
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1976, 13 (03): : 711 - 715
[13] JANSSEN AP, TO BE PUBLISHED
[14] AUGER ELECTRON SPECTROSCOPY IN SCANNING ELECTRON MICROSCOPE - AUGER ELECTRON IMAGES
MACDONALD, NC
WALDROP, JR
[J]. APPLIED PHYSICS LETTERS, 1971, 19 (09) : 315 - +
[15] MACDONALD NC, 1973, SCANNING AUGER MICRO
[16] PALMBERG PW, 1974, TRADE LITERATURE
[17] SCANNING AUGER-ELECTRON MICROSCOPE FOR SURFACE STUDIES
POWELL, BD
WOODRUFF, DP
GRIFFITHS, BW
[J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1975, 8 (07): : 548 - 552
[18] THEORETICAL COMPARISON OF ELECTRON-ENERGY ANALYZERS DEGRADED SO AS TO OBTAIN HIGH SENSITIVITY
PRUTTON, M
[J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1977, 11 (02) : 197 - 204
[19] REDHEAD PA, 1968, PHYSICAL BASIS ULTRA
[20] SEAH MP, 1973, 1973 NEWC TYN I PHYS