DIRECT OBSERVATION OF THE GROWTH-PROCESS OF AG THIN-FILM ON A HYDROGEN-TERMINATED SI(111) SURFACE

被引：21

作者：

NAITOH, M

SHOJI, F

OURA, K

机构：

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1992年 / 31卷 / 12A期

关键词：

FE-SEM OBSERVATION; HYDROGEN TERMINATION; FILM GROWTH; SI(111) SURFACE;

D O I：

10.1143/JJAP.31.4018

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Using a field emission scanning electron microscope (FE-SEM), we have observed the effects of the saturation of surface dangling bonds of Si(111) surfaces with atomic hydrogen upon Ag thin-film (approximately 10 monolayers) growth. In Ag deposition at high temperatures, we found that Ag islands grew to large sizes on a hydrogen-terminated surface compared with the results on the clean surface.

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页码：4018 / 4019

页数：2

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