A CRYSTAL SPECTROGRAPH FOR A SOFT-X-RAY MEASUREMENT IN IMPLODING PLASMA-EXPERIMENTS

被引：2

作者：

SHIMODA, K

YAMAMOTO, T

TAKADA, S

SONE, H

HIRANO, K

机构：

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1987年 / 26卷 / 03期

关键词：

D O I：

10.1143/JJAP.26.451

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：451 / 454

页数：4

共 13 条

[1] X-RAY-SPECTRA FROM A GAS-PUFF Z-PINCH DEVICE
BURKHALTER, PG
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[J]. JOURNAL OF APPLIED PHYSICS, 1979, 50 (07) : 4532 - 4540
[2] X-RAY-SPECTRA FROM EXPLODED-WIRE PLASMAS
BURKHALTER, PG
DOZIER, CM
NAGEL, DJ
[J]. PHYSICAL REVIEW A, 1977, 15 (02): : 700 - 717
[3] PROSPECTS FOR HIGH-BRIGHTNESS X-RAY SOURCES FOR LITHOGRAPHY
ECONOMOU, NP
FLANDERS, DC
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 19 (04): : 868 - 871
[4] MICROCHANNEL-PLATE INTENSIFIED CRYSTAL SPECTROMETER FOR USE IN SOFT-X-RAY SPECTROSCOPY
HAILEY, CJ
ROCKETT, P
ECKART, M
BURKHALTER, PG
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1985, 56 (08) : 1553 - 1556
[5] AN ABSOLUTE MEASURE OF HEATING BY SUPRATHERMAL ELECTRONS IN A GAS PUFF Z-PINCH
HARES, JD
MARRS, RE
FORTNER, RJ
[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1985, 18 (04) : 627 - 631
[6] 2-CHANNEL, ELLIPTICAL ANALYZER SPECTROGRAPH FOR ABSOLUTE, TIME-RESOLVING TIME-INTEGRATING SPECTROMETRY OF PULSED X-RAY SOURCES IN THE 100-10 000-EV REGION
HENKE, BL
JAANIMAGI, PA
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1985, 56 (08) : 1537 - 1552
[7] TIME CORRELATION BETWEEN PLASMA BEHAVIOR AND SOFT-X-RAY EMISSION IN A PLASMA-FOCUS
HIRANO, K
TAGAYA, Y
SHIMODA, K
OKABE, Y
YAMAMOTO, T
[J]. JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1986, 55 (07) : 2211 - 2216
[8] ACCURATE WAVELENGTH MEASUREMENTS OF HE-LIKE RESONANCE LINES OF TITANIUM THROUGH ZINC FROM A HIGH-TEMPERATURE PLASMA
MORITA, S
[J]. JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1983, 52 (08) : 2673 - 2683
[9] X-RAY-SPECTRA FROM H-LIKE, HE-LIKE AND LI-LIKE IRON IONS IN A VACUUM SPARK PLASMA
MORITA, S
FUJITA, J
[J]. JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1983, 52 (06) : 1957 - 1968
[10] SIMPLE MULTIPLE-CRYSTAL X-RAY SPECTROGRAPH
NAGEL, DJ
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1983, 54 (12) : 1797 - 1798

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