SOFT-X-RAY CORE LEVEL PHOTOEMISSION-STUDY OF THE CS INP INTERFACE FORMATION

被引：29

作者：

KENDELEWICZ, T ^{[1
]}

SOUKIASSIAN, P ^{[1
]}

BAKSHI, MH ^{[1
]}

HURYCH, Z ^{[1
]}

LINDAU, I ^{[1
]}

SPICER, WE ^{[1
]}

机构：

[1] NO ILLINOIS UNIV,DEPT PHYS,DE KALB,IL 60115

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1988年 / 6卷 / 04期

关键词：

D O I：

10.1116/1.584259

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：1331 / 1335

页数：5

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