FACTORS LIMITING THE SPATIAL-RESOLUTION AND SENSITIVITY OF EELS MICROANALYSIS IN A STEM

被引:2
作者
WEISS, JK
CARPENTER, RW
机构
[1] Center for Solid State Science, Arizona State University, Tempe
基金
美国国家科学基金会;
关键词
D O I
10.1016/0304-3991(92)90131-3
中图分类号
TH742 [显微镜];
学科分类号
摘要
The experimental parameters which limit the spatial resolution and sensitivity of parallel electron-energy-loss microanalysis have been reviewed in order to determine the limiting factors over a range of experimental conditions. The effects of the signal-detector characteristics and electron optics on the performance of the microanalytical technique have been quantified. The importance of statistical considerations (signal-to-noise ratios) and the specimen itself are considered in order to develop a non-arbitrary definition of microanalytical performance based not only on the electron beam dimensions, but also incorporating other experimental limitations.
引用
收藏
页码:339 / 351
页数:13
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