ELEVATED PRESSURE STUDY OF EFFECT OF DIFFERENT DONORS ON ELECTRON TRANSFER IN N-GAAS

被引:10
作者
ADLER, PN
机构
[1] Bayside Laboratory, Research Center of General Telephone, Electronics Laboratories, Bayside
关键词
D O I
10.1063/1.1658237
中图分类号
O59 [应用物理学];
学科分类号
摘要
The elevated-pressure resistance behavior of differently doped samples suggests that the ratio of mobility in the [000] conduction band to that in the [100] band is constant and independent of initial mobility. A mobility ratio of 39 is indicated at atmospheric pressure. Carrier freeze-out with respect to the [100] band was observed for S- and Si-doped samples but not with Se and Te. © 1969 The American Institute of Physics.
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页码:3554 / &
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