ABRUPT DEGRADATION OF 3 TYPES OF SEMICONDUCTOR LIGHT-EMITTING-DIODES AT HIGH-TEMPERATURE

被引:14
作者
UEDA, O
IMAI, H
FUJIWARA, T
YAMAKOSHI, S
SUGAWARA, T
YAMAOKA, T
机构
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D O I
10.1063/1.327445
中图分类号
O59 [应用物理学];
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页码:5316 / 5325
页数:10
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