MEASURING BULK CURRENTS ON SILICON RECTIFIERS AND A NEW METHOD OF ELIMINATING SURFACE EFFECT

被引：9

作者：

BURTSCHE.J

机构：

来源：

SOLID-STATE ELECTRONICS | 1969年 / 12卷 / 08期

关键词：

D O I：

10.1016/0038-1101(69)90033-1

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

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页码：591 / &

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