UV LASER-INDUCED DEPOSITION OF METAL-FILMS

[1] ALLEN SD, 1979, IEEE J QUANTUM ELECT, V15, pD43

[2] CHEMICAL VAPOR-DEPOSITION OF SILICON USING A CO2-LASER [J]. APPLIED PHYSICS LETTERS, 1978, 32 (04) : 254 - 256

[3] COOMBE RD, UNPUBLISHED

[4] LASER PHOTODEPOSITION OF METAL-FILMS WITH MICROSCOPIC FEATURES [J]. APPLIED PHYSICS LETTERS, 1979, 35 (02) : 175 - 177

[5] DEPOSITION OF METAL-FILMS BY THE CONTROLLED DECOMPOSITION OF ORGANOMETALLIC COMPOUNDS ON SURFACES [J]. THIN SOLID FILMS, 1980, 67 (01) : L25 - L28

[6] KIV AE, 1973, SOV PHYS SEMICOND+, V7, P429

[7] THE MEASUREMENT OF THE HEATS OF SUBLIMATION OF ZINC AND CADMIUM WITH THE MASS SPECTROMETER [J]. JOURNAL OF PHYSICAL CHEMISTRY, 1960, 64 (02) : 251 - 253

[8] SURFACE CLEANING IN THIN-FILM TECHNOLOGY [J]. THIN SOLID FILMS, 1978, 53 (01) : 81 - 96

[9] VIG J, 1973, 27TH P ANN S FREQ CO, P98

[10] Vig J.R., 1975, 29TH P ANN S FREQ CO, P220

[1] ALLEN SD, 1979, IEEE J QUANTUM ELECT, V15, pD43

[2] CHEMICAL VAPOR-DEPOSITION OF SILICON USING A CO2-LASER [J]. APPLIED PHYSICS LETTERS, 1978, 32 (04) : 254 - 256

[3] COOMBE RD, UNPUBLISHED

[4] LASER PHOTODEPOSITION OF METAL-FILMS WITH MICROSCOPIC FEATURES [J]. APPLIED PHYSICS LETTERS, 1979, 35 (02) : 175 - 177

[5] DEPOSITION OF METAL-FILMS BY THE CONTROLLED DECOMPOSITION OF ORGANOMETALLIC COMPOUNDS ON SURFACES [J]. THIN SOLID FILMS, 1980, 67 (01) : L25 - L28

[6] KIV AE, 1973, SOV PHYS SEMICOND+, V7, P429

[7] THE MEASUREMENT OF THE HEATS OF SUBLIMATION OF ZINC AND CADMIUM WITH THE MASS SPECTROMETER [J]. JOURNAL OF PHYSICAL CHEMISTRY, 1960, 64 (02) : 251 - 253

[8] SURFACE CLEANING IN THIN-FILM TECHNOLOGY [J]. THIN SOLID FILMS, 1978, 53 (01) : 81 - 96

[9] VIG J, 1973, 27TH P ANN S FREQ CO, P98

[10] Vig J.R., 1975, 29TH P ANN S FREQ CO, P220