SURFACE-ROUGHNESS MEASUREMENT USING WHITE-LIGHT SPECKLE

[11] MEES CEK, 1966, THEORY PHOTOGRAPHIC, P582

[12] ROUGH SURFACE INTERFEROMETRY USING A CO2 LASER SOURCE [J]. APPLIED OPTICS, 1968, 7 (09) : 1858 - +

[13] SURFACE-ROUGHNESS MEASUREMENT BY HOLOGRAPHIC INTERFEROMETRY [J]. APPLIED OPTICS, 1972, 11 (04): : 807 - &

[14] INTERFEROMETRIC SURFACE ROUGHNESS MEASUREMENT [J]. APPLIED OPTICS, 1969, 8 (11): : 2173 - &

[15] RIGDEN JD, 1962, P IRE, V50, P2367

[16] 0.63MU SCATTER MEASUREMENTS FROM TEFLON AND VARIOUS METALLIC SURFACES [J]. BELL SYSTEM TECHNICAL JOURNAL, 1965, 44 (08): : 1659 - +

[17] SKINNER TJ, 1964, THESIS BOSTON U

[18] SPRAGUE RA, 1972, J OPT SOC AM, V62, pA723

[19] THOMPSON BJ, 1966, IND PHOTOGR, V15, P24

[20] VELZE CHF, 1969, OPTICAL INSTRUMENTS

[11] MEES CEK, 1966, THEORY PHOTOGRAPHIC, P582

[12] ROUGH SURFACE INTERFEROMETRY USING A CO2 LASER SOURCE [J]. APPLIED OPTICS, 1968, 7 (09) : 1858 - +

[13] SURFACE-ROUGHNESS MEASUREMENT BY HOLOGRAPHIC INTERFEROMETRY [J]. APPLIED OPTICS, 1972, 11 (04): : 807 - &

[14] INTERFEROMETRIC SURFACE ROUGHNESS MEASUREMENT [J]. APPLIED OPTICS, 1969, 8 (11): : 2173 - &

[15] RIGDEN JD, 1962, P IRE, V50, P2367

[16] 0.63MU SCATTER MEASUREMENTS FROM TEFLON AND VARIOUS METALLIC SURFACES [J]. BELL SYSTEM TECHNICAL JOURNAL, 1965, 44 (08): : 1659 - +

[17] SKINNER TJ, 1964, THESIS BOSTON U

[18] SPRAGUE RA, 1972, J OPT SOC AM, V62, pA723

[19] THOMPSON BJ, 1966, IND PHOTOGR, V15, P24

[20] VELZE CHF, 1969, OPTICAL INSTRUMENTS