THE TRANSPORT-EQUATION APPROACH FOR THE SIMULATION OF CHARGE STATE FLUCTUATION EFFECTS DURING ION PENETRATION INTO SOLIDS

被引:13
作者
BURENKOV, AF
KOMAROV, FF
FEDOTOV, SA
机构
[1] Institute of Applied Physics Problems, Minsk, 220064
关键词
D O I
10.1016/0168-583X(92)95765-J
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A model for high-energy ion implantation taking account of ion charge state fluctuations is proposed and the corresponding forward and backward kinetic equations are formulated. The results of simulation by numerical solution of the transport equations are given. It is shown that talking account of high-energy fluctuations results in an increase in straggling of the implanted impurity and radiation defect distributions and gives better agreement with experiments than the standard simulations.
引用
收藏
页码:30 / 34
页数:5
相关论文
共 14 条
[2]   EFFECTIVE STOPPING-POWER CHARGES OF SWIFT IONS IN CONDENSED MATTER [J].
BRANDT, W ;
KITAGAWA, M .
PHYSICAL REVIEW B, 1982, 25 (09) :5631-5637
[3]   DEPTH DISTRIBUTION OF DEFECTS AND IMPURITIES IN DIAMOND AND CUBIC BORON-NITRIDE AFTER HIGH-ENERGY ION-IMPLANTATION [J].
BURENKOV, AF ;
VARYCHENKO, VS ;
ZAITSEV, AM ;
KOMAROV, FF ;
KONOPLYANIK, GG ;
MELNIKOV, AA ;
STELMAKH, VF ;
TKACHEV, VV .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1989, 115 (02) :427-435
[4]  
BURENKOV AF, 1986, TABLES ION IMPLANTAT, P465
[5]  
BURNEKOV AF, 1991, VACUUM, V42, P13
[6]   ELECTRONIC-PROPERTIES OF DEFECTS CREATED BY 1.6-GEV ARGON IONS IN SILICON [J].
KRYNICKI, J ;
TOULEMONDE, M ;
MULLER, JC ;
SIFFERT, P .
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1989, 2 (1-3) :105-110
[7]   IMPLANTS OF 15-50-MEV BORON IONS INTO SILICON [J].
LAFERLA, A ;
DIFRANCO, A ;
RIMINI, E ;
CIAVOLA, G ;
FERLA, G .
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1989, 2 (1-3) :69-73
[8]  
LINDHARD J, 1954, MAT FYS MEDD DAN VID, V28, P1
[9]   NON EQUILIBRIUM IONIZATION STATE OF SWIFT HEAVY-IONS IN DENSE MATTER [J].
MAYNARD, G ;
DEUTSCH, C .
RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1989, 110 (1-2) :157-159
[10]   A NEW METHOD FOR THE DETERMINATION OF X IN UO2+XO - OPTICAL-ABSORPTION SPECTROSCOPY MEASUREMENTS [J].
GRIFFITHS, TR ;
HUBBARD, HVS ;
ALLEN, GC ;
TEMPEST, PA .
JOURNAL OF NUCLEAR MATERIALS, 1988, 151 (03) :307-312