GROWTH-RATE ENHANCEMENT USING OZONE DURING RAPID THERMAL-OXIDATION OF SILICON

被引:36
作者
KAZOR, A [1 ]
GWILLIAM, R [1 ]
BOYD, IW [1 ]
机构
[1] UNIV SURREY,DEPT ELECTR & ELECT ENGN,SERC,CENT FACIL ION BEAM TECHNOL,GUILDFORD GU2 5XH,SURREY,ENGLAND
关键词
D O I
10.1063/1.112318
中图分类号
O59 [应用物理学];
学科分类号
摘要
Rapid thermal oxidation of Si in a mixed oxygen and ozone ambient in the temperature range of 600-1200-degrees-C is reported. Between 600 and 800-degrees-C a large enhancement in oxidation is observed compared with conventional oxide growth in a pure oxygen ambient. For temperatures above 950-degrees-C conventional thermal oxidation dominates and no significant enhancement is found.
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页码:412 / 414
页数:3
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