A SELF-CONSISTENT ANALYSIS OF TEMPERATURE-DEPENDENT FIELD-EFFECT MEASUREMENTS IN HYDROGENATED AMORPHOUS-SILICON THIN-FILM TRANSISTORS

被引：38

作者：

SCHROPP, REI

SNIJDER, J

VERWEY, JF

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1986年 / 60卷 / 02期

关键词：

D O I：

10.1063/1.337407

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：643 / 649

页数：7

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