MODULATION SPECTROSCOPY CHARACTERIZATION OF MOCVD SEMICONDUCTORS AND SEMICONDUCTOR STRUCTURES

被引：13

作者：

POLLAK, FH ^{[1
]}

SHEN, H ^{[1
]}

机构：

[1] CUNY GRAD SCH & UNIV CTR,NEW YORK,NY 10036

来源：

JOURNAL OF CRYSTAL GROWTH | 1989年 / 98卷 / 1-2期

关键词：

D O I：

10.1016/0022-0248(89)90185-1

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

引用

页码：53 / 64

页数：12

共 30 条

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