DIGITAL ETCHING OF GAAS - NEW APPROACH OF DRY ETCHING TO ATOMIC ORDERED PROCESSING

被引:77
作者
MEGURO, T
HAMAGAKI, M
MODARESSI, S
HARA, T
AOYAGI, Y
ISHII, M
YAMAMOTO, Y
机构
[1] HOSEI UNIV,COLL ENGN,KOGANEI,TOKYO 184,JAPAN
[2] HOSEI UNIV,ION BEAM TECHNOL RES CTR,KOGANEI,TOKYO 184,JAPAN
关键词
D O I
10.1063/1.103171
中图分类号
O59 [应用物理学];
学科分类号
摘要
A new approach to dry etching of GaAs, digital etching, has been demonstrated. In digital etching, the etchant and an energetic beam, which induces chemical sputtering at the surface, alternately impinge onto the surface. Electrons and Cl2 gas were used as the energetic beam and the etchant, respectively, in the present experiment. Etching rates of 1/3 monolayer/cycle, independent of Cl2 flux and electron current density, were obtained. The present results show that an inherent self-limiting mechanism is involved and that the etching process is limited by the adsorption of etchant. This digital etching technique is expected to be applied to the fabrication of well-defined quantum wire and quantum box structures.
引用
收藏
页码:1552 / 1554
页数:3
相关论文
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