GAMMA-COMPTON EXPERIMENT WITH AN ANNULAR AM-241 SOURCE - MOMENTUM RESOLUTION AND RELIABILITY MEASUREMENTS

被引：8

作者：

BONSE, U

SCHRODER, W

SCHULKE, W

机构：

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1979年 / 12卷 / OCT期

关键词：

D O I：

10.1107/S0021889879012978

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：432 / 435

页数：4

共 8 条

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SCHULKE, W .

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[6]

WEYRICH W, 1975, BER BUNSEN PHYS CHEM, V79, P1089

[7]

Williams, 1977, COMPTON SCATTERING

[8]

Williams B. G., 1976, Acta Crystallographica, Section A (Crystal Physics, Diffraction, Theoretical and General Crystallography), VA32, P513, DOI 10.1107/S0567739476001149

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