共 11 条
[1]
SPUTTER-INDUCED ROUGHNESS IN THERMAL SIO2 DURING AUGER SPUTTER PROFILING STUDIES OF THE SI-SIO2 INTERFACE
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY,
1980, 17 (01)
:44-46
[10]
MODEL OF ION KNOCK-ON MIXING WITH APPLICATION TO SI-SIO2 INTERFACE STUDIES
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY,
1979, 16 (02)
:781-783