THE FORMATION OF TITANIUM SILICIDE BY ARSENIC ION-BEAM MIXING AND RAPID THERMAL ANNEALING

被引:16
作者
SHUKLA, RK
DAVIES, PW
TRACY, BM
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1986年 / 4卷 / 06期
关键词
D O I
10.1116/1.583456
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:1344 / 1351
页数:8
相关论文
共 10 条
  • [1] RECOIL CONTRIBUTION TO ION-IMPLANTATION ENERGY-DEPOSITION DISTRIBUTIONS
    BRICE, DK
    [J]. JOURNAL OF APPLIED PHYSICS, 1975, 46 (08) : 3385 - 3394
  • [2] DAVIES P, UNPUB J ELECTROCHEM
  • [3] DOWBEN SL, 1985, P MATER RES SOC S, V48, P355
  • [4] AMBIENT GAS EFFECTS ON THE REACTION OF TITANIUM WITH SILICON
    IYER, SS
    TING, CY
    FRYER, PM
    [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1985, 132 (09) : 2240 - 2245
  • [5] MITRA UN, 1986, 5TH P INT S SIL MAT, P316
  • [6] INFLUENCE OF THE INTERFACIAL OXIDE ON TITANIUM SILICIDE FORMATION BY RAPID THERMAL ANNEALING
    PRAMANIK, D
    SAXENA, AN
    WU, OK
    PETERSON, GG
    TANIELIAN, M
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1984, 2 (04): : 775 - 780
  • [7] Shibata T., 1981, International Electron Devices Meeting, P647
  • [8] TSAUR BY, 1979, THIN SOLID FILMS, V63, P31, DOI 10.1016/0040-6090(79)90095-6
  • [9] SELECTIVE TUNGSTEN SILICIDE FORMATION BY ION-BEAM MIXING AND RAPID THERMAL ANNEALING
    TSAUR, BY
    CHEN, CK
    ANDERSON, CH
    KWONG, DL
    [J]. JOURNAL OF APPLIED PHYSICS, 1985, 57 (06) : 1890 - 1894
  • [10] INTERFACE MODIFICATION OF REFRACTORY METAL-SILICON STRUCTURES BY ION-IMPLANTATION
    WANG, KL
    BACON, F
    REIHL, RF
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1979, 16 (06): : 1909 - 1912