FORCES IN ATOMIC FORCE MICROSCOPY IN AIR AND WATER

被引：580

作者：

WEISENHORN, AL ^{[1
]}

HANSMA, PK ^{[1
]}

ALBRECHT, TR ^{[1
]}

QUATE, CF ^{[1
]}

机构：

[1] STANFORD UNIV,DEPT APPL PHYS,STANFORD,CA 94305

来源：

APPLIED PHYSICS LETTERS | 1989年 / 54卷 / 26期

关键词：

D O I：

10.1063/1.101024

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：2651 / 2653

页数：3

共 24 条

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[3]

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QUATE, CF .

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[8]

BURNHAM NA, 1986, J VAC SCI TECHNOL A, V7

[9] IMAGING CRYSTALS, POLYMERS, AND PROCESSES IN WATER WITH THE ATOMIC FORCE MICROSCOPE [J].

DRAKE, B ;

PRATER, CB ;

WEISENHORN, AL ;

GOULD, SAC ;

ALBRECHT, TR ;

QUATE, CF ;

CANNELL, DS ;

HANSMA, HG ;

HANSMA, PK .

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[10] ATOMIC FORCE MICROSCOPY USING OPTICAL INTERFEROMETRY [J].

ERLANDSSON, R ;

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MATE, CM ;

CHIANG, S .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02) :266-270

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