NIOBIUM JOSEPHSON JUNCTIONS WITH DOPED AMORPHOUS SILICON BARRIERS

被引:26
作者
KROGER, H
POTTER, CN
JILLIE, DW
机构
[1] Sperry Research Center, Sudbury
关键词
D O I
10.1109/TMAG.1979.1060117
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Nb-(a-Si)-Nb Josephson devices have been prepared by rf sputtering* The silicon films were deposited in an argon-hydrogen atmosphere. Such films can be activated as either n-or p-type.semiconductors by the incorporation of phosphorus or boron, and the Fermi level of the material can be moved a considerable fraction of the bandgap. The Josephson current density of n-type layers is found to be substantially greater than p-type layers of the same thickness. © 1979 IEEE
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收藏
页码:488 / 489
页数:2
相关论文
共 10 条
[1]   TUNNELING BETWEEN SUPERCONDUCTORS [J].
AMBEGAOKAR, V ;
BARATOFF, A .
PHYSICAL REVIEW LETTERS, 1963, 10 (11) :486-&
[2]  
BROOM RF, 1975, 14 P INT C LOW TEMP, V4, P172
[3]   USE OF LOW BARRIER POTENTIAL MATERIALS TO IMPROVE HIGH-FREQUENCY COUPLING TO JOSEPHSON TUNNEL-JUNCTIONS [J].
CARDINNE, P ;
NORDMAN, J ;
RENARD, M .
REVUE DE PHYSIQUE APPLIQUEE, 1974, 9 (01) :167-171
[4]  
HARRIS RE, 1978, 44 AIP C P, P448
[5]   SCHOTTKY DIODES AND OTHER DEVICES ON THIN SILICON MEMBRANES [J].
HUANG, CL ;
VANDUZER, T .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1976, 23 (06) :579-583
[6]   ALL-REFRACTORY WEAK-LINK SQUIDS FOR USE IN JOSEPHSON LOGIC AND MEMORY APPLICATIONS [J].
JILLIE, DW ;
KROGER, H .
IEEE TRANSACTIONS ON MAGNETICS, 1979, 15 (01) :486-487
[7]   DOPING, SCHOTTKY-BARRIER AND P-N-JUNCTION FORMATION IN AMORPHOUS-GERMANIUM AND SILICON BY RF SPUTTERING [J].
PAUL, W ;
LEWIS, AJ ;
CONNELL, GAN ;
MOUSTAKAS, TD .
SOLID STATE COMMUNICATIONS, 1976, 20 (10) :969-972
[8]  
POTTER CN, UNPUBLISHED
[10]   ELECTRONIC PROPERTIES OF SUBSTITUTED DOPED AMORPHOUS SI AND GE [J].
SPEAR, WE ;
LECOMBER, PG .
PHILOSOPHICAL MAGAZINE, 1976, 33 (06) :935-949