LOW-RESISTIVITY W/WSIX BILAYER GATES FOR SELF-ALIGNED GAAS METAL-SEMICONDUCTOR FIELD-EFFECT TRANSISTOR LARGE-SCALE INTEGRATED-CIRCUITS

被引:13
作者
KANAMORI, M
NAGAI, K
NOZAKI, T
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1987年 / 5卷 / 05期
关键词
D O I
10.1116/1.583608
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
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页码:1317 / 1320
页数:4
相关论文
共 6 条
[1]   PIEZOELECTRIC EFFECTS IN GAAS-FETS AND THEIR ROLE IN ORIENTATION-DEPENDENT DEVICE CHARACTERISTICS [J].
ASBECK, PM ;
LEE, CP ;
CHANG, MCF .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1984, 31 (10) :1377-1380
[2]  
Nakamura H., 1983, GaAs IC Symposium. IEEE Gallium Arsenide Integrated Circuit Symposium. Technical Digest 1983, P134
[3]   CHARACTERIZATION OF WSIX/GAAS SCHOTTKY CONTACTS [J].
OHNISHI, T ;
YOKOYAMA, N ;
ONODERA, H ;
SUZUKI, S ;
SHIBATOMI, A .
APPLIED PHYSICS LETTERS, 1983, 43 (06) :600-602
[4]   ORIGIN OF INTERNAL STRESS IN LOW-VOLTAGE SPUTTERED TUNGSTEN FILMS [J].
SUN, RC ;
TISONE, TC ;
CRUZAN, PD .
JOURNAL OF APPLIED PHYSICS, 1975, 46 (01) :112-117
[5]   CHARACTERISTICS OF WN/GAAS SCHOTTKY CONTACTS FORMED BY REACTIVE RF SPUTTERING [J].
YAMAGISHI, H .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1984, 23 (12) :L895-L898
[6]   TIW SILICIDE GATE SELF-ALIGNMENT TECHNOLOGY FOR ULTRAHIGH-SPEED GAAS-MESFET LSI VLSIS [J].
YOKOYAMA, N ;
OHNISHI, T ;
ODANI, K ;
ONODERA, H ;
ABE, M .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1982, 29 (10) :1541-1547