TESTING FOR MOS IC FAILURE MODES

被引：21

作者：

EDWARDS, DG

机构：

来源：

关键词：

D O I：

10.1109/TR.1982.5221212

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：9 / 18

页数：10

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