MEASUREMENT OF THE SILICON (220) LATTICE SPACING

被引：104

作者：

BASILE, G

BERGAMIN, A

CAVAGNERO, G

MANA, G

VITTONE, E

ZOSI, G

机构：

[1] UNIV TURIN,DIPARTIMENTO FIS SPERIMENTALE,I-10125 TURIN,ITALY

[2] UNIV TURIN,IST FIS GEN A AVOGADRO,I-10125 TURIN,ITALY

来源：

PHYSICAL REVIEW LETTERS | 1994年 / 72卷 / 20期

关键词：

D O I：

10.1103/PhysRevLett.72.3133

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The (220) lattice spacing of a silicon crystal was measured by combined x-ray and optical interferometry to about 3 x 10(-8) relative accuracy. The value obtained is d220 = 192015.551 +/- 0.005 fm. After correcting for the impurity-induced lattice contraction, d220 = 192 015.569 +/- 0.006 fm is obtained.

引用

页码：3133 / 3136

页数：4

共 26 条

[1] ACCOTTO A, IN PRESS
[2] ON THE CONSTRUCTION OF A ZERODUR TRANSLATION DEVICE FOR X-RAY INTERFEROMETRIC SCANNING
ALEMANNI, M
MANA, G
PEDROTTI, G
STRONA, PP
ZOSI, G
[J]. METROLOGIA, 1986, 22 (01) : 55 - 63
[3] PHASE MODULATION IN HIGH-RESOLUTION OPTICAL INTERFEROMETRY
BASILE, G
BERGAMIN, A
CAVAGNERO, G
MANA, G
[J]. METROLOGIA, 1992, 28 (06) : 455 - 461
[4] SILICON LATTICE-CONSTANT - LIMITS IN IMGC X-RAY OPTICAL INTERFEROMETRY
BASILE, G
BERGAMIN, A
CAVAGNERO, G
MANA, G
VITTONE, E
ZOSI, G
[J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1991, 40 (02) : 98 - 102
[5] PROGRESS AT IMGC IN THE ABSOLUTE DETERMINATION OF THE SILICON D(220) LATTICE SPACING
BASILE, G
BERGAMIN, A
CAVAGNERO, G
MANA, G
ZOSI, G
[J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1989, 38 (02) : 210 - 216
[6] THE LATTICE-PARAMETER OF HIGHLY PURE SILICON SINGLE-CRYSTALS
BECKER, P
SEYFRIED, P
SIEGERT, H
[J]. ZEITSCHRIFT FUR PHYSIK B-CONDENSED MATTER, 1982, 48 (01): : 17 - 21
[7] ABSOLUTE MEASUREMENT OF THE (220)-LATTICE PLANE SPACING IN A SILICON CRYSTAL
BECKER, P
DORENWENDT, K
EBELING, G
LAUER, R
LUCAS, W
PROBST, R
RADEMACHER, HJ
REIM, G
SEYFRIED, P
SIEGERT, H
[J]. PHYSICAL REVIEW LETTERS, 1981, 46 (23) : 1540 - 1543
[8] BECKER P, COMMUNICATION
[9] ACCURACY ASSESSMENT OF A LEAST-SQUARES ESTIMATOR FOR SCANNING-X-RAY INTERFEROMETRY
BERGAMIN, A
CAVAGNERO, G
MANA, G
[J]. MEASUREMENT SCIENCE AND TECHNOLOGY, 1991, 2 (08) : 725 - 734
[10] PHASE HOLONOMY IN OPTICAL INTERFEROMETRY
BERGAMIN, A
CAVAGNERO, G
MANA, G
[J]. JOURNAL OF MODERN OPTICS, 1992, 39 (10) : 2053 - 2074

← 1 2 3 →