MULTILAYERS FOR X-RAY OPTICS

[81] SOFT-X-RAY IMAGING WITH A NORMAL INCIDENCE MIRROR [J]. NATURE, 1981, 294 (5840) : 429 - 431

[82] GRAZING-INCIDENCE DIFFRACTION AND THE DISTORTED-WAVE APPROXIMATION FOR THE STUDY OF SURFACES [J]. PHYSICAL REVIEW B, 1982, 26 (08): : 4146 - 4159

[83] X-RAY AND FAR UV MULTILAYER MIRRORS - PRINCIPLES AND POSSIBILITIES [J]. APPLIED OPTICS, 1977, 16 (01): : 89 - 93

[84] Vossen J.L., 1978, THIN FILM PROCESSES

[85] COMPARISON BETWEEN TI ANOMALOUS X-RAY-SCATTERING FACTORS OBTAINED FROM LAYERED SYNTHETIC MICROSTRUCTURES AND THE DISPERSION RELATIONSHIP [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, 1985, 2 (04) : 565 - 567

[86] WARBURTON WK, UNPUB HIGH OPTIC QUA

[87] WARBURTON WK, 1984, XRAY MICROSCOPY, P163

[88] WARBURTON WK, UNPUB PERFORMANCE TE

[89] WRIGHT JG, 1975, EPITAXIAL GROWTH, P73

[90] ZEIGLER E, 1984, THESIS U PARIS SUD C

[81] SOFT-X-RAY IMAGING WITH A NORMAL INCIDENCE MIRROR [J]. NATURE, 1981, 294 (5840) : 429 - 431

[82] GRAZING-INCIDENCE DIFFRACTION AND THE DISTORTED-WAVE APPROXIMATION FOR THE STUDY OF SURFACES [J]. PHYSICAL REVIEW B, 1982, 26 (08): : 4146 - 4159

[83] X-RAY AND FAR UV MULTILAYER MIRRORS - PRINCIPLES AND POSSIBILITIES [J]. APPLIED OPTICS, 1977, 16 (01): : 89 - 93

[84] Vossen J.L., 1978, THIN FILM PROCESSES

[85] COMPARISON BETWEEN TI ANOMALOUS X-RAY-SCATTERING FACTORS OBTAINED FROM LAYERED SYNTHETIC MICROSTRUCTURES AND THE DISPERSION RELATIONSHIP [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, 1985, 2 (04) : 565 - 567

[86] WARBURTON WK, UNPUB HIGH OPTIC QUA

[87] WARBURTON WK, 1984, XRAY MICROSCOPY, P163

[88] WARBURTON WK, UNPUB PERFORMANCE TE

[89] WRIGHT JG, 1975, EPITAXIAL GROWTH, P73

[90] ZEIGLER E, 1984, THESIS U PARIS SUD C