ELECTRONIC-STRUCTURE AND PROPERTIES OF SPUTTERED TA-CU FILMS

被引:9
作者
AYLESWORTH, KD
JASWAL, SS
ENGELHARDT, MA
ZHAO, ZR
SELLMYER, DJ
机构
来源
PHYSICAL REVIEW B | 1988年 / 37卷 / 05期
关键词
D O I
10.1103/PhysRevB.37.2426
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:2426 / 2432
页数:7
相关论文
共 36 条
[21]   EVIDENCE FOR THE ELECTRONIC STRUCTURE-SENSITIVE ELECTRON-TRANSPORT IN CU50ZR50-XALX (0-LESS-THAN-OR-EQUAL-TO X-LESS-THAN-OR-EQUAL-TO 50) METALLIC GLASSES [J].
MIZUTANI, U ;
YAMADA, Y ;
MISHIMA, C ;
MATSUDA, T .
SOLID STATE COMMUNICATIONS, 1987, 62 (09) :641-644
[22]  
MIZUTANI U, 1985, 5TH P INT C RAP QUEN
[23]   TEMPERATURE-DEPENDENCE OF RESISTIVITY IN METALLIC GLASSES [J].
NAGEL, SR .
PHYSICAL REVIEW B, 1977, 16 (04) :1694-1698
[24]   ELECTRON-TRANSPORT IN CALCIUM-BASED METALLIC GLASSES [J].
NAUGLE, DG ;
DELGADO, R ;
ARMBRUSTER, H ;
TSAI, CL ;
CALLAWAY, TO ;
REYNOLDS, D ;
MORUZZI, VL .
PHYSICAL REVIEW B, 1986, 34 (12) :8279-8287
[25]  
OELHAFEN P, 1983, TOP APPL PHYS, V53, P283
[26]   THERMAL AND STRUCTURAL STABILITY OF COSPUTTERED AMORPHOUS TAXCU1-X ALLOY THIN-FILMS ON GAAS [J].
OH, JE ;
WOOLLAM, JA ;
AYLESWORTH, KD ;
SELLMYER, DJ ;
POUCH, JJ .
JOURNAL OF APPLIED PHYSICS, 1986, 60 (12) :4281-4286
[27]   LOCALIZATION AND ELECTRON-INTERACTION EFFECTS IN METALLIC GLASSES [J].
POON, SJ ;
WONG, KM ;
DREHMAN, AJ .
PHYSICAL REVIEW B, 1985, 31 (03) :1668-1670
[28]   LOW-TEMPERATURE PROPERTIES AND LOCALIZATION EFFECTS IN AMORPHOUS THIN-FILMS OF W-RE [J].
RAFFY, H ;
LAIBOWITZ, RB .
PHYSICAL REVIEW B, 1984, 30 (10) :5541-5551
[29]  
RAO KV, 1983, AMORPHOUS METALLIC A
[30]   ELECTRONIC-TRANSPORT PROPERTIES OF AMORPHOUS CU-TI FILMS [J].
RATHNAYAKA, KDD ;
KAISER, AB ;
TRODAHL, HJ .
PHYSICAL REVIEW B, 1986, 33 (02) :889-894