VERSATILE THIN-FILM METHOD FOR QUANTITATIVE X-RAY-EMISSION ANALYSIS

被引：17

作者：

CHUNG, FH ^{[1
]}

LENTZ, AJ ^{[1
]}

SCOTT, RW ^{[1
]}

机构：

[1] SHERWIN WILLIAMS RES CTR,CHICAGO,IL 60628

来源：

关键词：

D O I：

10.1002/xrs.1300030411

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

页码：172 / 175

页数：4

共 11 条

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[2] CLINE JE, 1969, PHYSICAL MEASUREMENT, P83
[3] CROKE JF, 1967, HDB XRAYS, pCH33
[4] FINNEGAN JJ, 1962, ADVAN XRAY ANAL, V5, P500
[5] TRACE-ELEMENT DETERMINATION WITH SEMICONDUCTOR DETECTOR X-RAY SPECTROMETERS
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GOULDING, FS
JAKLEVIC, JM
PEHL, RH
[J]. ANALYTICAL CHEMISTRY, 1973, 45 (04) : 671 - 681
[6] X-RAY FLUORESCENT INTENSITY OF ELEMENTS EVAPORATED FROM SOLUTION ONTO THIN FILM
GUNN, EL
[J]. ANALYTICAL CHEMISTRY, 1961, 33 (07) : 921 - &
[7] JENKINS R, 1967, PRACTICAL XRAY SPECT, P21
[8] FILM THICKNESS BY X-RAY EMISSION SPECTROGRAPHY
LIEBHAFSKY, HA
ZEMANY, PD
[J]. ANALYTICAL CHEMISTRY, 1956, 28 (04) : 455 - 459
[9] X-RAY EMISSION ANALYSIS OF PAINTS BY THIN FILM METHOD
MCGINNESS, JD
SCOTT, RW
MORTENSE.JS
[J]. ANALYTICAL CHEMISTRY, 1969, 41 (13) : 1858 - +
[10] Muller R. O., 1972, SPECTROCHEMICAL ANAL, P59