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SECONDARY ION EMISSION AND SPUTTER YIELDS FROM METAL TARGETS UNDER F2+ BOMBARDMENT

被引：11
作者：
REUTER, W
CLABES, JG
机构：
来源：
ANALYTICAL CHEMISTRY | 1988年 / 60卷 / 14期
关键词：
D O I：
10.1021/ac00165a012
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
引用
收藏
页码：1404 / 1408
页数：5
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