MODEL FOR A VANDERWAALS INTERACTION BETWEEN A METALLIC PROBE AND A DIELECTRIC SURFACE - IMPLICATION FOR ATOMIC FORCE MICROSCOPY

被引：5

作者：

MAGHEZZI, S ^{[1
]}

GIRARD, C ^{[1
]}

VANLABEKE, D ^{[1
]}

机构：

[1] UNIV FRANCHE COMTE, OPT PM DUFFIEUX LAB, CNRS, UA 214, F-25030 BESANCON, FRANCE

来源：

JOURNAL DE PHYSIQUE I | 1991年 / 1卷 / 02期

关键词：

D O I：

10.1051/jp1:1991132

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The van der Waals interaction force between a metallic tip and a non planar dielectric is derived from a non local formalism. A general formulation is given for a spherical tip of nanometric size and for surfaces of arbitrary shape (monocrystal adsorbed on planar surfaces). The dispersion part of the attractive force is obtained from a non local theory expressed in terms of generalized electric susceptibilities of the two partners. Implications for atomic force microscopy in attractive mode are also discussed.

引用

页码：289 / 307

页数：19

共 33 条

[1] EFFECT OF TIP PROFILE ON ATOMIC-FORCE MICROSCOPE IMAGES - A MODEL STUDY [J].

ABRAHAM, FF ;

BATRA, IP ;

CIRACI, S .

PHYSICAL REVIEW LETTERS, 1988, 60 (13) :1314-1317

[2] ATOMIC RESOLUTION IMAGING OF A NONCONDUCTOR BY ATOMIC FORCE MICROSCOPY [J].

ALBRECHT, TR ;

QUATE, CF .

JOURNAL OF APPLIED PHYSICS, 1987, 62 (07) :2599-2602

[3] ATOMIC RESOLUTION WITH THE ATOMIC FORCE MICROSCOPE ON CONDUCTORS AND NONCONDUCTORS [J].

ALBRECHT, TR ;

QUATE, CF .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02) :271-274

[4] THEORETICAL SCANNING TUNNELING MICROSCOPY AND ATOMIC FORCE MICROSCOPY STUDY OF GRAPHITE INCLUDING TIP SURFACE INTERACTION [J].

BATRA, IP ;

CIRACI, S .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02) :313-318

[5] ATOMIC FORCE MICROSCOPE [J].

BINNIG, G ;

QUATE, CF ;

GERBER, C .

PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933

[6] ENERGY-DEPENDENT STATE-DENSITY CORRUGATION OF A GRAPHITE SURFACE AS SEEN BY SCANNING TUNNELING MICROSCOPY [J].

BINNIG, G ;

FUCHS, H ;

GERBER, C ;

ROHRER, H ;

STOLL, E ;

TOSATTI, E .

EUROPHYSICS LETTERS, 1986, 1 (01) :31-36

[7] ATOMIC RESOLUTION WITH ATOMIC FORCE MICROSCOPE [J].

BINNIG, G ;

GERBER, C ;

STOLL, E ;

ALBRECHT, TR ;

QUATE, CF .

EUROPHYSICS LETTERS, 1987, 3 (12) :1281-1286

[8] THE SCANNING TUNNELING MICROSCOPE [J].

BINNIG, G ;

ROHRER, H .

SCIENTIFIC AMERICAN, 1985, 253 (02) :50-&

[9] PROBING THE SURFACE FORCES OF MONOLAYER FILMS WITH AN ATOMIC-FORCE MICROSCOPE [J].

BURNHAM, NA ;

DOMINGUEZ, DD ;

MOWERY, RL ;

COLTON, RJ .

PHYSICAL REVIEW LETTERS, 1990, 64 (16) :1931-1934

[10] TIP-SAMPLE INTERACTION EFFECTS IN SCANNING-TUNNELING AND ATOMIC-FORCE MICROSCOPY [J].

CIRACI, S ;

BARATOFF, A ;

BATRA, IP .

PHYSICAL REVIEW B, 1990, 41 (05) :2763-2775

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