We describe the results of optical and electrical characterization of seeded physical vapor transport (SPVT) ZnSe suitable for use as substrates in homoepitaxy. Photoluminescence, Hall measurements, C-V data and thermally simulated conductivity and luminescence (TSC/TL) results are described. As-grown SPVT wafers are of very high crystallinity and of high resistivity. N-type conductivity can be induced by post-growth Zn-extraction, producing wafers with room temperature resistivities as low as 3.82 OMEGA cm and free carrier densities of approximately 1.5 x 10(15) cm-3. The conductivity is limited by the presence of unwanted acceptors due to Cu and Li impurities. Deep level analysis reveals various electron and hole states within the as-grown specimens. Trap depths and capture cross-sections are evaluated for the major centers.