PREPARATION AND USES OF SILICA REPLICAS IN ELECTRON MICROSCOPY

被引：15

作者：

GEROULD, CH

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1947年 / 18卷 / 04期

关键词：

D O I：

10.1063/1.1697655

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

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页码：333 / 343

页数：11

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[1] ELECTRON MICROSCOPICAL REPLICA TECHNIQUES FOR THE STUDY OF ORGANIC SURFACES
BARNES, RB
BURTON, CJ
SCOTT, RG
[J]. JOURNAL OF APPLIED PHYSICS, 1945, 16 (11) : 730 - 739
[2] The electron microscope in metallurgical research
Barrett, CS
[J]. JOURNAL OF APPLIED PHYSICS, 1944, 15 (10) : 691 - 696
[3] PREPARATION OF ELECTRON MICROSCOPE SPECIMENS FOR DETERMINATION OF PARTICLE SIZE DISTRIBUTION IN AQUEOUS SUSPENSIONS
CRAVATH, AM
SMITH, AE
VINOGRAD, JR
WILSON, JN
[J]. JOURNAL OF APPLIED PHYSICS, 1946, 17 (04) : 309 - 310
[4] Mounting of pigments for electron microscopy
Fuller, ML
Brubaker, DG
Berger, RW
[J]. JOURNAL OF APPLIED PHYSICS, 1944, 15 (02) : 201 - 201
[5] GEROULD CH, 1944, J DENT RES, V23, P239
[6] Fine structure of metallic surfaces with the electron microscope
Heidenreich, RD
Peck, VG
[J]. JOURNAL OF APPLIED PHYSICS, 1943, 14 (01) : 23 - 29
[7] TECHNIQUES IN APPLIED ELECTRON MICROSCOPY
HEIDENREICH, RD
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1945, 35 (02) : 139 - 148
[8] INVESTIGATION OF SECONDARY PHASES IN ALLOYS BY ELECTRON DIFFRACTION AND THE ELECTRON MICROSCOPE
HEIDENREICH, RD
STURKEY, L
WOODS, HL
[J]. JOURNAL OF APPLIED PHYSICS, 1946, 17 (02) : 127 - 136
[9] Electron microscopic determination of surface elevations and orientations
Heidenreich, RD
Matheson, LA
[J]. JOURNAL OF APPLIED PHYSICS, 1944, 15 (05) : 423 - 435
[10] HEIDENREICH RD, 1945, SAE J T, V53, P588