LOW-ENERGY ELECTRON-DIFFRACTION ANALYSIS OF THE SI(111)7X7 STRUCTURE

被引：179

作者：

TONG, SY ^{[1
]}

HUANG, H ^{[1
]}

WEI, CM ^{[1
]}

PACKARD, WE ^{[1
]}

MEN, FK ^{[1
]}

GLANDER, G ^{[1
]}

WEBB, MB ^{[1
]}

机构：

[1] UNIV WISCONSIN,SURFACE STUDIES LAB,MADISON,WI 53706

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1988年 / 6卷 / 03期

关键词：

D O I：

10.1116/1.575179

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：615 / 624

页数：10

共 28 条

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[2] STACKING-FAULT MODEL FOR THE SI(111)-(7X7) SURFACE
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[3] 7X7 RECONSTRUCTION ON SI(111) RESOLVED IN REAL SPACE
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[J]. PHYSICAL REVIEW LETTERS, 1983, 50 (02) : 120 - 123
[4] ATOMIC DISPLACEMENTS IN THE SI(111)-(7X7) SURFACE
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[5] SURFACE RECONSTRUCTION ON SEMICONDUCTORS
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[6] STRUCTURAL MODEL FOR SI(111)-(7X7)
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[J]. PHYSICAL REVIEW B, 1983, 27 (12): : 7782 - 7785
[7] STRUCTURAL MODELS FOR SI(111)-(7X7)
HIMPSEL, FJ
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[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1984, 2 (02): : 952 - 956
[8] HUANG H, IN PRESS
[9] MacLaren J. M., 1987, HDB SURFACE STRUCTUR
[10] SURFACE STACKING-SEQUENCE AND (7 X 7) RECONSTRUCTION AT SI(111) SURFACES
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[J]. PHYSICAL REVIEW B, 1983, 28 (04): : 2305 - 2307