REAL-TIME OBSERVATION OF OXYGEN AND HYDROGEN ADSORPTION ON SILICON SURFACES BY SCANNING TUNNELING MICROSCOPY

被引：71

作者：

TOKUMOTO, H

MIKI, K

MURAKAMI, H

BANDO, H

ONO, M

KAJIMURA, K

机构：

[1] Electrotechnical Laboratory, Ibaraki 305, Umezono, Tsukuba

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1990年 / 8卷 / 01期

关键词：

D O I：

10.1116/1.577079

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

[No abstract available]

引用

页码：255 / 258

页数：4

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