LUCKY DRIFT ESTIMATION OF EXCESS NOISE FACTOR FOR CONVENTIONAL AVALANCHE PHOTODIODES INCLUDING THE DEAD SPACE EFFECT

被引：45

作者：

MARSLAND, JS ^{[1
]}

WOODS, RC ^{[1
]}

BROWNHILL, CA ^{[1
]}

机构：

[1] UNIV SHEFFIELD,DEPT ELECTR & ELECT ENGN,SHEFFIELD S1 3JD,S YORKSHIRE,ENGLAND

来源：

IEEE TRANSACTIONS ON ELECTRON DEVICES | 1992年 / 39卷 / 05期

关键词：

D O I：

10.1109/16.129093

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A new technique for estimating the excess noise factor in conventional avalanche photodiodes has been developed. It is based upon a computer simulation of carrier motion using lucky drift concepts. The importance of the impact ionization dead space is demonstrated and an established theory is shown to overestimate the excess noise factor due to the neglect of the dead space phenomenon in conventional avalanche photodiodes.

引用

页码：1129 / 1135

页数：7

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