ATOMIC-SCALE TRIBOMETER FOR FRICTION STUDIES IN A CONTROLLED-ATMOSPHERE

被引:21
作者
BINGGELI, M [1 ]
CHRISTOPH, R [1 ]
HINTERMANN, HE [1 ]
MARTI, O [1 ]
机构
[1] UNIV CONSTANCE,DEPT PHYS,W-7750 CONSTANCE,GERMANY
关键词
D O I
10.1016/0257-8972(93)90294-X
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
To obtain a more fundamental understanding of macroscopic tribological processes, investigations on a microscopic or even atomic scale have to be undertaken. Macroscopic mechanical concepts of adhesion and friction phenomena are not adequate for explaining ''nanomechanics''. The development of local probe techniques (scanning tunneling microscopy, atomic force microscopy) offered powerful new tools for studying microscopic, i.e. local, surface properties. One possible application of these instruments is local friction investigation by simulating a single asperity contact of a real surface with an atomic force microscope tip, and measuring normal and lateral forces occurring at the tip while imaging a sample. With respect to the enormous effect of environmental conditions on which local tribological interactions take place, rigorous control of the atmosphere is needed. We present details of an instrument suited for carrying out local friction investigations in controlled atmospheric conditions or on samples embedded in an extended experimental environment. The instrument's conception and possible applications are described, especially its combination with an electrochemical cell and potentiostatic control of a sample immersed in electrolytes. First results obtained with such a set-up are presented.
引用
收藏
页码:523 / 528
页数:6
相关论文
共 24 条
[1]   AN ATOMIC-RESOLUTION ATOMIC-FORCE MICROSCOPE IMPLEMENTED USING AN OPTICAL-LEVER [J].
ALEXANDER, S ;
HELLEMANS, L ;
MARTI, O ;
SCHNEIR, J ;
ELINGS, V ;
HANSMA, PK ;
LONGMIRE, M ;
GURLEY, J .
JOURNAL OF APPLIED PHYSICS, 1989, 65 (01) :164-167
[2]  
AMER NM, 1988, B AM PHYS SOC, V33, P319
[3]   ELECTROLYTIC SCANNING TUNNELING MICROSCOPY AND POINT CONTACT STUDIES AT ELECTROCHEMICALLY POLISHED AU(111) SUBSTRATES WITH AND WITHOUT PB ADSORBATES [J].
BINGGELI, M ;
CARNAL, D ;
NYFFENEGGER, R ;
SIEGENTHALER, H ;
CHRISTOPH, R ;
ROHRER, H .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (04) :1985-1992
[4]  
Binggeli M., 1993, Nanotechnology, V4, P59, DOI 10.1088/0957-4484/4/2/001
[5]   ATOMIC FORCE MICROSCOPE [J].
BINNIG, G ;
QUATE, CF ;
GERBER, C .
PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933
[6]   7X7 RECONSTRUCTION ON SI(111) RESOLVED IN REAL SPACE [J].
BINNIG, G ;
ROHRER, H ;
GERBER, C ;
WEIBEL, E .
PHYSICAL REVIEW LETTERS, 1983, 50 (02) :120-123
[7]   FORCE MICROSCOPY [J].
BINNIG, G .
ULTRAMICROSCOPY, 1992, 42 :7-15
[8]  
BRUGGER J, 1993, IN PRESS 7TH P INT C
[9]  
Colchero J., 1992, Physica Status Solidi A, V131, P73, DOI 10.1002/pssa.2211310112
[10]  
DOWSON D, 1979, HISTT TRIBOLOGY