LARGE AREA VUV SOURCE FOR THIN-FILM PROCESSING

被引:10
作者
YU, Z
COLLINS, GJ
机构
[1] Department of Electrical Engineering, Colorado State University, Fort Collins, CO
来源
PHYSICA SCRIPTA | 1990年 / 41卷 / 01期
关键词
D O I
10.1088/0031-8949/41/1/006
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
A large area disc shaped vacuum ultraviolet (VUV) light source, from 2 cm to 20 cm in diameter, has been developed. It employs a soft vacuum electron beam emitted from a cathode of ring shape to excite the disc shaped plasma. The Lyman alpha emission 2p 2P0-1s 2S at the wavelength of 121.6 nm, dominates the emission spectra when running a hydrogen discharge while the N I line 3s 4P-2p 4S0 at 120.0 nm, dominates in a disc shaped nitrogen discharge. The 121.5 nm 4d 2D-2p 2P0 line of He II is observed to dominate in the helium discharge when measurements are made through a 10-15 cm long column of neutral helium. The intensity of VUV emission has a measured uniformity of ±6% over the central 15 cm of the 20 cm diameter disc using atomic helium, molecular N2 and H2. The windowless disc plasma is also a source of radical and excited atomic gas species. VUV photons, excited species, and radicals can all assist dissociation of CVD feedstock reactants via volume photo-absorption and sensitized atom-molecule collisions, respectively. In addition, the excited radical flux and VUV impingement on the film may also assist heterogeneous surface reactions and increase surface mobility of absorbed species. Thin films of aluminum nitride, Si3N4, and hydrogenated amorphous silicon have been deposited at temperatures between 100-400°C. The deposited films show significant improvement over other photo-assisted CVD processes in the film quality achieved, the substrate temperature required and the maximum deposition rates achieved. © 1990 IOP Publishing Ltd.
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页码:25 / 27
页数:3
相关论文
共 13 条
[1]  
DONNELLY VM, 1979, CHEM PHYS, V213, P218
[2]   LASER MICROPHOTOCHEMISTRY FOR USE IN SOLID-STATE ELECTRONICS [J].
EHRLICH, DJ ;
OSGOOD, RM ;
DEUTSCH, TF .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 1980, 16 (11) :1233-1243
[3]   TIME-RESOLVED SPECTROSCOPIC STUDIES OF THE ULTRAVIOLET-LASER PHOTOLYSIS OF AL ALKYLS FOR FILM GROWTH [J].
ERES, D ;
MOTOOKA, T ;
GORBATKIN, S ;
LUBBEN, D ;
GREENE, JE .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1987, 5 (04) :848-852
[4]  
HIROSE M, 1984, SEMICONDUCT SEMIMET, V21, P9
[5]  
KLOSE JZ, 1987, APPL OPTICS, V26, P5202, DOI 10.1364/AO.26.5202_1
[6]   ALN SUBSTRATES WITH HIGH THERMAL-CONDUCTIVITY [J].
KUROKAWA, Y ;
UTSUMI, K ;
TAKAMIZAWA, H ;
KAMATA, T ;
NOGUCHI, S .
IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY, 1985, 8 (02) :247-252
[7]   ALUMINUM-NITROGEN POLYMERS BY CONDENSATION REACTIONS [J].
LAUBENGAYER, A ;
SMITH, JD ;
EHRLICH, GG .
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1961, 83 (03) :542-&
[8]  
MOORE CA, 1988, HDB THIN FILMS DEPOS, pCH10
[9]   VACUUM ULTRAVIOLET SPECTRAL-IRRADIANCE CALIBRATIONS - METHOD AND APPLICATIONS [J].
OTT, WR ;
BRIDGES, JM ;
KLOSE, JZ .
OPTICS LETTERS, 1980, 5 (06) :225-227
[10]   DISK HYDROGEN PLASMA ASSISTED CHEMICAL VAPOR-DEPOSITION OF ALUMINUM NITRIDE [J].
SHENG, TY ;
YU, ZQ ;
COLLINS, GJ .
APPLIED PHYSICS LETTERS, 1988, 52 (07) :576-578