INTERNAL QUANTUM EFFICIENCY OF GE PHOTODIODES

[1] PRECISION MEASUREMENT OF ABSOLUTE SPECULAR REFLECTANCE WITH MINIMIZED SYSTEMATIC ERRORS [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1960, 50 (01) : 1 - 6

[2] INTRINSIC OPTICAL ABSORPTION IN SINGLE-CRYSTAL GERMANIUM AND SILICON AT 77-DEGREES-K AND 300-DEGREES-K [J]. PHYSICAL REVIEW, 1955, 99 (04): : 1151 - 1155

[3] MOSTL K, 1984, KOHLRAUSCH PRAKTISCH, V1, P519

[4] OPTICAL CONSTANTS OF GERMANIUM IN THE REGION-1 TO 10 EV [J]. PHYSICAL REVIEW, 1959, 113 (04): : 1002 - 1005

[5] SCHWARTZ RJ, 1984, P OPT RAD MEAS SPIE, V499, P2

[6] STOCK KD, 1985, OPTIK, V71, P137

[7] SI-PHOTODIODE SPECTRAL NONLINEARITY IN THE INFRARED [J]. APPLIED OPTICS, 1986, 25 (06): : 830 - 832

[8] STOCK KD, 1984, OPTOELEKTRONIK TECHN, P75

[9] STOCK KD, 1987, IN PRESS IMEKO J MEA

[10] STOCK KD, 1982, 10TH P INT S PHOT DE, P40

[1] PRECISION MEASUREMENT OF ABSOLUTE SPECULAR REFLECTANCE WITH MINIMIZED SYSTEMATIC ERRORS [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1960, 50 (01) : 1 - 6

[2] INTRINSIC OPTICAL ABSORPTION IN SINGLE-CRYSTAL GERMANIUM AND SILICON AT 77-DEGREES-K AND 300-DEGREES-K [J]. PHYSICAL REVIEW, 1955, 99 (04): : 1151 - 1155

[3] MOSTL K, 1984, KOHLRAUSCH PRAKTISCH, V1, P519

[4] OPTICAL CONSTANTS OF GERMANIUM IN THE REGION-1 TO 10 EV [J]. PHYSICAL REVIEW, 1959, 113 (04): : 1002 - 1005

[5] SCHWARTZ RJ, 1984, P OPT RAD MEAS SPIE, V499, P2

[6] STOCK KD, 1985, OPTIK, V71, P137

[7] SI-PHOTODIODE SPECTRAL NONLINEARITY IN THE INFRARED [J]. APPLIED OPTICS, 1986, 25 (06): : 830 - 832

[8] STOCK KD, 1984, OPTOELEKTRONIK TECHN, P75

[9] STOCK KD, 1987, IN PRESS IMEKO J MEA

[10] STOCK KD, 1982, 10TH P INT S PHOT DE, P40