PRECISION OVER-UNDER 4-POINT PROBE WITH SMALL PROBE SPACING

被引：8

作者：

SCHUMANN, PA

SHEINER, LS

机构：

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1964年 / 35卷 / 08期

关键词：

D O I：

10.1063/1.1718960

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：959 / &

共 13 条

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[9] A NOVEL 4-POINT PROBE FOR EPITAXIAL AND BULK SEMICONDUCTOR RESISTIVITY MEASUREMENTS [J].

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[10]

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