COMPOSITIONAL ANALYSIS OF LEAD TITANATE THIN-FILMS BY AUGER-ELECTRON SPECTROSCOPY AND THEIR ELECTRICAL-PROPERTIES

被引：5

作者：

YOON, SG

LEE, HY

KIM, HG

机构：

来源：

THIN SOLID FILMS | 1989年 / 171卷 / 02期

关键词：

D O I：

10.1016/0040-6090(89)90632-9

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：251 / 262

页数：12

共 22 条

[1]

Barrett C.S., 1980, STRUCTURE METALS, P205

[2] INVESTIGATION OF PYROELECTRIC MATERIAL CHARACTERISTICS FOR IMPROVED INFRARED DETECTOR PERFORMANCE [J].

BEERMAN, HP .

INFRARED PHYSICS, 1975, 15 (03) :225-231

[3] ION-BEAM DEPOSITION OF THIN-FILMS OF FERROELECTRIC LEAD ZIRCONATE TITANATE (PZT) [J].

CASTELLANO, RN ;

FEINSTEIN, LG .

JOURNAL OF APPLIED PHYSICS, 1979, 50 (06) :4406-4411

[4] AUGER ELECTRON SPECTROSCOPY [J].

CHANG, CC .

SURFACE SCIENCE, 1971, 25 (01) :53-+

[5]

DAVIS LE, 1976, HDB AUGER ELECTRON S

[6] QUANTITATIVE AUGER-ELECTRON ANALYSIS OF TITANIUM NITRIDES [J].

DAWSON, PT ;

TZATZOV, KK .

SURFACE SCIENCE, 1985, 149 (01) :105-118

[7]

FAVRILYACHENKO VG, 1970, FIZ TVERD TELA+, V12, P1203

[8]

Jaffe B, 1971, PIEZOELECTRIC CERAMI, P12

[9]

Kojima M., 1983, Japanese Journal of Applied Physics, Supplement, V22, P14

[10] RF PLANAR MAGNETRON SPUTTERING AND CHARACTERIZATION OF FERROELECTRIC PB(ZR,TI)O3 FILMS [J].

KRUPANIDHI, SB ;

MAFFEI, N ;

SAYER, M ;

ELASSAL, K .

JOURNAL OF APPLIED PHYSICS, 1983, 54 (11) :6601-6609

← 1 2 3 →