PRECISE DETERMINATION OF THE VALENCE-BAND EDGE IN X-RAY PHOTOEMISSION SPECTRA - APPLICATION TO MEASUREMENT OF SEMICONDUCTOR INTERFACE POTENTIALS

被引：1261

作者：

KRAUT, EA

GRANT, RW

WALDROP, JR

KOWALCZYK, SP

机构：

来源：

PHYSICAL REVIEW LETTERS | 1980年 / 44卷 / 24期

关键词：

D O I：

10.1103/PhysRevLett.44.1620

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

收藏

页码：1620 / 1623

页数：4

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