A PHYSICAL SHORT-CHANNEL MODEL FOR THE THIN-FILM SOI MOSFET APPLICABLE TO DEVICE AND CIRCUIT CAD

被引:85
作者
VEERARAGHAVAN, S [1 ]
FOSSUM, JG [1 ]
机构
[1] UNIV FLORIDA, DEPT ELECT ENGN, GAINESVILLE, FL 32611 USA
关键词
D O I
10.1109/16.7399
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:1866 / 1875
页数:10
相关论文
共 25 条
[1]  
ARMSTRONG GA, 1986, SIMULATION SEMICONDU, V2, P449
[2]   MEASUREMENT OF MOSFET CONSTANTS [J].
DELAMONEDA, FH ;
KOTECHA, HN ;
SHATZKES, M .
ELECTRON DEVICE LETTERS, 1982, 3 (01) :10-12
[3]  
ELMANSY YA, 1975, IEDM
[4]  
FITZPATRICK D, 1987, SLICE SPICE2 REV 5 0
[5]   MODEL SELECTION FOR SOI MOSFET CIRCUIT SIMULATION [J].
FOSSUM, JG ;
VEERARAGHAVAN, S ;
FITZPATRICK, D .
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 1988, 7 (04) :541-544
[6]   SIGNIFICANCE OF THE CHANNEL CHARGE PARTITION IN THE TRANSIENT MOSFET MODEL [J].
FOSSUM, JG ;
JEONG, H ;
VEERARAGHAVAN, S .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1986, 33 (10) :1621-1623
[7]   CONDUCTANCE OF MOS TRANSISTORS IN SATURATION [J].
FROHMANB.D ;
GROVE, AS .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1969, ED16 (01) :108-+
[8]  
KATO K, 1985, 2ND INT WORKSH FUT E, P123
[9]  
KRULL W, COMMUNICATION
[10]  
LIM HK, 1985, IEEE T ELECTRON DEV, V32, P446