EVALUATION OF ALTERNATIVE ALGORITHMS FOR DYNAMIC IMAGING MICROELLIPSOMETRY

被引:6
作者
COHN, RF
机构
[1] Worcester Polytechnic Institute, Center for Holographic Studies and Laser Technology, Worcester, MA
来源
APPLIED OPTICS | 1990年 / 29卷 / 02期
关键词
D O I
10.1364/AO.29.000304
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
An investigation of four alternative radiometric algorithms for dynamic imaging microellipsometry (a rapid full field imaging technique for thin films) is reported. Three exact solutions and a Fourier series approach are presented and compared in terms of random and systematic errors and processing requirements. Variations in performance based on assumed system specifications are of the order of 0.3 and 0.06° rms random error for A and respectively, with systematic error differences around 0.4° for A and 0.15° for Ψ. Processing requirements are generally similar. The three-image algorithms are recommended for high speed applications and the Fourier series for high accuracy. © 1990 Optical Society of America.
引用
收藏
页码:304 / 315
页数:12
相关论文
共 6 条
[1]  
Cohn R. F., 1989, Proceedings of the SPIE - The International Society for Optical Engineering, V1036, P125
[2]   DYNAMIC IMAGING MICROELLIPSOMETRY - PROOF OF CONCEPT TEST-RESULTS [J].
COHN, RF ;
WAGNER, JW ;
KRUGER, J .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1988, 135 (04) :1033-1034
[3]   ABSOLUTE AND RANDOM ERROR ANALYSIS OF THE DYNAMIC IMAGING MICROELLIPSOMETRY TECHNIQUE [J].
COHN, RF ;
WAGNER, JW .
APPLIED OPTICS, 1989, 28 (15) :3187-3198
[4]   DYNAMIC IMAGING MICROELLIPSOMETRY - THEORY, SYSTEM-DESIGN, AND FEASIBILITY DEMONSTRATION [J].
COHN, RF ;
WAGNER, JW ;
KRUGER, J .
APPLIED OPTICS, 1988, 27 (22) :4664-4671
[5]  
COHN RF, 1989, REV PROGR QUANTITATI, V8, P1219
[6]  
Wylie C.R., 1975, ADV ENG MATH