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STUDY OF AL-PD2SI CONTACTS ON SI
被引:43
作者
:
GRINOLDS, H
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MINNESOTA,DEPT ELECT ENGN,MINNEAPOLIS,MN 55455
UNIV MINNESOTA,DEPT ELECT ENGN,MINNEAPOLIS,MN 55455
GRINOLDS, H
[
1
]
ROBINSON, GY
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MINNESOTA,DEPT ELECT ENGN,MINNEAPOLIS,MN 55455
UNIV MINNESOTA,DEPT ELECT ENGN,MINNEAPOLIS,MN 55455
ROBINSON, GY
[
1
]
机构
:
[1]
UNIV MINNESOTA,DEPT ELECT ENGN,MINNEAPOLIS,MN 55455
来源
:
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY
|
1977年
/ 14卷
/ 01期
关键词
:
D O I
:
10.1116/1.569177
中图分类号
:
O59 [应用物理学];
学科分类号
:
摘要
:
引用
收藏
页码:75 / 78
页数:4
相关论文
共 8 条
[1]
STRUCTURE AND ELECTRICAL CHARACTERISTICS OF EPITAXIAL PALLADIUM SILICIDE CONTACTS ON SINGLE-CRYSTAL SILICON AND DIFFUSED P-N DIODES
BUCKLEY, WD
论文数:
0
引用数:
0
h-index:
0
BUCKLEY, WD
MOSS, SC
论文数:
0
引用数:
0
h-index:
0
MOSS, SC
[J].
SOLID-STATE ELECTRONICS,
1972,
15
(12)
: 1331
-
&
[2]
STUDY OF PD2SI FILMS ON SILICON USING AUGER-ELECTRON SPECTROSCOPY
FERTIG, DJ
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MINNESOTA,DEPT ELECT ENGN,MINNEAPOLIS,MN 55455
UNIV MINNESOTA,DEPT ELECT ENGN,MINNEAPOLIS,MN 55455
FERTIG, DJ
ROBINSON, GY
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MINNESOTA,DEPT ELECT ENGN,MINNEAPOLIS,MN 55455
UNIV MINNESOTA,DEPT ELECT ENGN,MINNEAPOLIS,MN 55455
ROBINSON, GY
[J].
SOLID-STATE ELECTRONICS,
1976,
19
(05)
: 407
-
413
[3]
ELECTRICAL AND MECHANICAL FEATURES OF PLATINUM SILICIDE-ALUMINUM REACTION
HOSACK, HH
论文数:
0
引用数:
0
h-index:
0
机构:
GE CO, SYRACUSE, NY 13201 USA
GE CO, SYRACUSE, NY 13201 USA
HOSACK, HH
[J].
JOURNAL OF APPLIED PHYSICS,
1973,
44
(08)
: 3476
-
3485
[4]
KINETICS OF COMPOUND FORMATION IN THIN-FILM COUPLES OF AL AND TRANSITION-METALS
HOWARD, JK
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,SYST PROD DIV,HOPEWELL JUNCTION,NY 12533
HOWARD, JK
LEVER, RF
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,SYST PROD DIV,HOPEWELL JUNCTION,NY 12533
LEVER, RF
SMITH, PJ
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,SYST PROD DIV,HOPEWELL JUNCTION,NY 12533
SMITH, PJ
HO, PS
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,SYST PROD DIV,HOPEWELL JUNCTION,NY 12533
HO, PS
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY,
1976,
13
(01):
: 68
-
71
[5]
METALLURGICAL PROPERTIES AND ELECTRICAL CHARACTERISTICS OF PALLADIUM SILICIDE-SILICON CONTACTS
KIRCHER, CJ
论文数:
0
引用数:
0
h-index:
0
KIRCHER, CJ
[J].
SOLID-STATE ELECTRONICS,
1971,
14
(06)
: 507
-
+
[6]
PALLADIUM SILICIDE FORMATION OBSERVED BY AUGER-ELECTRON SPECTROSCOPY
ROBINSON, GY
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MINNESOTA,DEPT ELECT ENGN,MINNEAPOLIS,MN 55455
UNIV MINNESOTA,DEPT ELECT ENGN,MINNEAPOLIS,MN 55455
ROBINSON, GY
[J].
APPLIED PHYSICS LETTERS,
1974,
25
(03)
: 158
-
160
[7]
METALLURGICAL AND ELECTRICAL PROPERTIES OF ALLOYED NI-AU-GE FILMS ON N-TYPE GAAS
ROBINSON, GY
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MINNESOTA,ELECT ENGN DEPT,MINNEAPOLIS,MN 55455
UNIV MINNESOTA,ELECT ENGN DEPT,MINNEAPOLIS,MN 55455
ROBINSON, GY
[J].
SOLID-STATE ELECTRONICS,
1975,
18
(04)
: 331
-
&
[8]
SZE SM, 1969, PHYSICS SEMICONDUCTO, pCH8
←
1
→
共 8 条
[1]
STRUCTURE AND ELECTRICAL CHARACTERISTICS OF EPITAXIAL PALLADIUM SILICIDE CONTACTS ON SINGLE-CRYSTAL SILICON AND DIFFUSED P-N DIODES
BUCKLEY, WD
论文数:
0
引用数:
0
h-index:
0
BUCKLEY, WD
MOSS, SC
论文数:
0
引用数:
0
h-index:
0
MOSS, SC
[J].
SOLID-STATE ELECTRONICS,
1972,
15
(12)
: 1331
-
&
[2]
STUDY OF PD2SI FILMS ON SILICON USING AUGER-ELECTRON SPECTROSCOPY
FERTIG, DJ
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MINNESOTA,DEPT ELECT ENGN,MINNEAPOLIS,MN 55455
UNIV MINNESOTA,DEPT ELECT ENGN,MINNEAPOLIS,MN 55455
FERTIG, DJ
ROBINSON, GY
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MINNESOTA,DEPT ELECT ENGN,MINNEAPOLIS,MN 55455
UNIV MINNESOTA,DEPT ELECT ENGN,MINNEAPOLIS,MN 55455
ROBINSON, GY
[J].
SOLID-STATE ELECTRONICS,
1976,
19
(05)
: 407
-
413
[3]
ELECTRICAL AND MECHANICAL FEATURES OF PLATINUM SILICIDE-ALUMINUM REACTION
HOSACK, HH
论文数:
0
引用数:
0
h-index:
0
机构:
GE CO, SYRACUSE, NY 13201 USA
GE CO, SYRACUSE, NY 13201 USA
HOSACK, HH
[J].
JOURNAL OF APPLIED PHYSICS,
1973,
44
(08)
: 3476
-
3485
[4]
KINETICS OF COMPOUND FORMATION IN THIN-FILM COUPLES OF AL AND TRANSITION-METALS
HOWARD, JK
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,SYST PROD DIV,HOPEWELL JUNCTION,NY 12533
HOWARD, JK
LEVER, RF
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,SYST PROD DIV,HOPEWELL JUNCTION,NY 12533
LEVER, RF
SMITH, PJ
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,SYST PROD DIV,HOPEWELL JUNCTION,NY 12533
SMITH, PJ
HO, PS
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,SYST PROD DIV,HOPEWELL JUNCTION,NY 12533
HO, PS
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY,
1976,
13
(01):
: 68
-
71
[5]
METALLURGICAL PROPERTIES AND ELECTRICAL CHARACTERISTICS OF PALLADIUM SILICIDE-SILICON CONTACTS
KIRCHER, CJ
论文数:
0
引用数:
0
h-index:
0
KIRCHER, CJ
[J].
SOLID-STATE ELECTRONICS,
1971,
14
(06)
: 507
-
+
[6]
PALLADIUM SILICIDE FORMATION OBSERVED BY AUGER-ELECTRON SPECTROSCOPY
ROBINSON, GY
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MINNESOTA,DEPT ELECT ENGN,MINNEAPOLIS,MN 55455
UNIV MINNESOTA,DEPT ELECT ENGN,MINNEAPOLIS,MN 55455
ROBINSON, GY
[J].
APPLIED PHYSICS LETTERS,
1974,
25
(03)
: 158
-
160
[7]
METALLURGICAL AND ELECTRICAL PROPERTIES OF ALLOYED NI-AU-GE FILMS ON N-TYPE GAAS
ROBINSON, GY
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MINNESOTA,ELECT ENGN DEPT,MINNEAPOLIS,MN 55455
UNIV MINNESOTA,ELECT ENGN DEPT,MINNEAPOLIS,MN 55455
ROBINSON, GY
[J].
SOLID-STATE ELECTRONICS,
1975,
18
(04)
: 331
-
&
[8]
SZE SM, 1969, PHYSICS SEMICONDUCTO, pCH8
←
1
→