HIGH-QUALITY SI-DOPED GAAS-LAYERS GROWN BY MOLECULAR-BEAM EPITAXY

被引:21
作者
SHIMANOE, T
MUROTANI, T
NAKATANI, M
OTSUBO, M
MITSUI, S
机构
[1] Semiconductor Laboratory, Mitsubishi Electric Corp., Itami, Hyogo, 4-1, Mizuhara
关键词
D O I
10.1016/0039-6028(79)90387-X
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
High quality Si-doped MBE. GaAs layers with high reproducibility have been grown by minimizing the incorporation of impurity species. The electrical and optical properties, and the doping characteristics of the Si-doped layers have been studied, and compared with those of Sn-doped layers. Hall mobility has indicated a low level of compensation in both the Si- and Sn-doped layers. The photoluminescence intensity of the Si-doped layers has been as high as that of the Sn-doped layers. Si-doped layers have shown more abrupt doping profiles than those of the Sn-doped layers, even when the surface segregation effect of the Sn-doped layers has not been observed. The difference in the doping profiles between the Si- and Sn-doped layers is discussed. © 1979.
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页码:126 / 136
页数:11
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