THE DECONVOLUTION OF SPUTTER-ETCHING SURFACE CONCENTRATION MEASUREMENTS TO DETERMINE IMPURITY DEPTH PROFILES

被引:5
作者
CARTER, G
KATARDJIEV, IV
NOBES, MJ
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关键词
D O I
10.1002/sia.740140905
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
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页码:511 / 523
页数:13
相关论文
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